Tuesday, 28 November 2017

BP Pump 2 NIBP Blood Pressure Simulator

BP Pump 2 NIBP Blood Pressure Simulator

Welcome to a Biomedical Battery specialist of the Fluke Battery

The BP Pump 2 provides dynamic blood-pressure simulations for testing adult and neonatal noninvasive blood pressure monitors, including both arm- and wrist-cuff types. The analyzer features a preset mode for simulation of most patient conditions and the capability to program user-defined simulations. BP Pump 2 tests for leaks, measures static pressure, generates pressure, and tests overpressure valves with battery such as Fluke BP123S Battery, Fluke BP124 Battery, Fluke BP124S Battery, Fluke BP124X Battery, Fluke Ti27 Battery, Agilent E6080A Battery, Nihon Kohden ECG-1250A Battery, Nihon Kohden ECG-1250C Battery, Nihon Kohden ECG-1250P Battery, Spacelabs mCare300D Battery, LI202S-7800 Battery, Spacelabs Battery. For improved testing versatility, the analyzer’s recently upgraded waveform test suite includes additional physiological selections. BP Pump 2 comes in two models: the standard BP Pump 2L and the BP Pump 2M, which features a high-accuracy pressure transducer. BP Pump 2 also includes an optional five-lead ECG test capability.

•Dynamic simulations for arm- and wrist-cuff monitors
•Physiological waveform
•Internal pump for use in high- and low-pressure release verification, leak testing and pressure sourcing
•Preset mode for simulation of most patient conditions
•User-definable systolic and diastolic values, along with heart rate and pulse volume and user-defined autosequences
•Internal cuff volume for basic device testing
•Respiratory artifacts, including spontaneous breathing and controlled ventilation
•Arrhythmia simulations, including premature atrial contractions #1 and #2, atrial fibrillation, and PVCs
•PC based ansur test automation system to standardize testing protocol and documentation (optional)
•High-accuracy pressure transducer (BP Pump2M only)
•Dynamic pressure repeatability within 2 mmHg at maximal pulse size independent of device under test

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